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Compatibility of Silicon Gates with Hafnium-Based Gate Dielectrics
AuthID
P-014-YYM
19
Author(s)
Gilmer, DC
·
Hegde, R
·
Cotton, R
·
Smith, J
·
Dip, L
·
Garcia, R
·
Dhandapani, V
·
Triyoso, D
·
Roan, D
·
Franke, A
·
Rai, R
·
Prabhu, L
·
Hobbs, C
·
Grant, JM
·
La, L
·
Samavedam, S
·
Taylor, B
·
Tseng, H
·
Tobin, P
Document Type
Proceedings Paper
Year published
2003
Published
in
MICROELECTRONIC ENGINEERING,
ISSN: 0167-9317
Volume: 69, Issue: 2-4, Pages: 138-144 (7)
Indexing
Wos
®
Crossref
®
22
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1016/s0167-9317(03)00290-9
Wos
: WOS:000185725300005
Source Identifiers
ISSN
: 0167-9317
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