Publications

On the Efficient Reduction of Complete Em Based Parametric Models

AuthID
P-003-PN3

Author(s)

Villena, JF

Ciuprina, G

Ioan, D

Silveira, LM

Document Type

Proceedings Paper

Year published

2009

Published

in DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3 in Design Automation and Test in Europe Conference and Expo, ISSN: 1530-1591

Pages: 1172-1177 (6)

Conference

Design, Automation and Test in Europe Conference and Exhibition, Date: APR 20-24, 2009, Location: Nice, FRANCE, Sponsors: European Design and Automation Association;EDA Consortium;IEEE Computer Society TTTC;IEEE Council on Electronic Design Automation, CEDA;ECSI

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