Special Issues and Methods for Testing Lnas at High Frequencies

AuthID
 P-003-PQK
4
Author(s)
4
Editor(s)
ElTahawy, H; Abadir, M; Jerraya, A; Salem, A
Document Type
Proceedings Paper
Year published
2009
Published
in DTIS: 2009 4TH IEEE INTERNATIONAL CONFERENCE ON DESIGN & TECHNOLOGY OF INTEGRATED SYSTEMS IN NANOSCALE ERA, PROCEEDINGS
Pages: 277-280 (4)
Conference
4Th Ieee International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Date: APR 06-07, 2009, Location: Cairo, EGYPT, Sponsors: IEEE Circuits & Syst Soc, IEEE Egypt
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Publication Identifiers
Wos: WOS:000269052000048
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