Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications

AuthID
 P-015-8YR
6
Author(s)
Kuhne, P
·
Armakavicius, N
·
Herzinger, CM
·
Schubert, M
·
Darakchieva, V
Document Type
Article
Year published
2018
Published
in IEEE Transactions on Terahertz Science and Technology, ISSN: 2156-342X
Volume: 8, Issue: 3, Pages: 257-270
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Source Identifiers
ISSN: 2156-342X
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