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Eddy Current Inspection of a Duralumin Plate
AuthID
P-003-QA0
4
Author(s)
Ribeiro, AL
·
Alegria, F
·
Postolache, O
·
Geirinhas Ramos, HMG
Document Type
Proceedings Paper
Year published
2009
Published
in
I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
in
IEEE Instrumentation and Measurement Technology Conference,
ISSN: 1091-5281
Pages: 1341-1345 (5)
Conference
26Th Ieee International Instrumentation and Measurement Technology Conference,
Date:
MAY 05-07, 2009,
Location:
Singapore, SINGAPORE,
Sponsors:
IEEE Instrumentat & Measurement Soc, IEEE Singapore Sect, Singapore Polytechn
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Publication Identifiers
DOI
:
10.1109/imtc.2009.5168669
SCOPUS
: 2-s2.0-70450079172
Wos
: WOS:000277153600264
Source Identifiers
ISSN
: 1091-5281
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