The Partial Average Power as a Fault Diagnostic Parameter Applied to Srm Drives

AuthID
 P-003-QEV
2
Author(s)
Document Type
Proceedings Paper
Year published
2009
Published
in IECON: 2009 35TH ANNUAL CONFERENCE OF IEEE INDUSTRIAL ELECTRONICS, VOLS 1-6
Pages: 1261-1266 (6)
Conference
35Th Annual Conference of the Ieee-Industrial-Electronics-Society (Iecon 2009), Date: NOV 03-05, 2009, Location: Porto, PORTUGAL, Sponsors: IEEE Ind Elect Soc
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-77951573966
Wos: WOS:000280762000212
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service