Rutherford Backscattering Spectrometry Characterization of Nanoporous Chalcogenide Thin Films Grown at Oblique Angles

AuthID
 P-015-GYQ
5
Author(s)
Martín-Palma R.J.
·
Gago R.
·
Ryan J.V.
·
Pantano C.G.
Document Type
Article
Year published
2008
Published
in Journal of Analytical Atomic Spectrometry, ISSN: 02679477
Volume: 23, Issue: 7, Pages: 981-984 (3)
Indexing
Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-46149105952
Source Identifiers
ISSN: 02679477
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service