Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to Iii-Nitride Semiconductors

AuthID
 P-000-C20
3
Author(s)
Sequeira, AD
4
Editor(s)
Martins, R; Fortunato, E; Ferreira, I; Dias, C
Document Type
Article
Year published
2004
Published
in ADVANCED MATERIALS FORUM II in MATERIALS SCIENCE FORUM, ISSN: 0255-5476
Volume: 455-456, Pages: 132-136 (5)
Conference
2Nd International Materials Symposium, Date: APR 14-16, 2003, Location: Caparica, PORTUGAL, Sponsors: Portuguese Mat Soc, Portuguese Sci Fdn, Calouste Gulbenkian Fdn, Luso Amer Fdn, Host: New Univ Lisbon, Fac Sci & Technol
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Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-3142749045
Wos: WOS:000222018500029
Source Identifiers
ISSN: 0255-5476
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