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Transmission Electron Microscopy Analysis of the Interfaces of Tialn/Mo Multilayers
AuthID
P-003-WP7
4
Author(s)
Tavares, CJ
·
Rebouta, L
·
Riviere, JP
·
Denanot, MF
Document Type
Editorial Material
Year published
2008
Published
in
MICROSCOPY AND MICROANALYSIS,
ISSN: 1431-9276
Volume: 14, Issue: SUPPL. 3, Pages: 1-4 (4)
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Publication Identifiers
DOI
:
10.1017/s1431927608089204
SCOPUS
: 2-s2.0-53349142265
Wos
: WOS:000207534900001
Source Identifiers
ISSN
: 1431-9276
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