Tem and Sem In-Situ Annealing of Nanocrystalline Copper Thin Films

AuthID
 P-003-WPP
6
Author(s)
Document Type
Editorial Material
Year published
2008
Published
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 14, Issue: SUPPL. 3, Pages: 49-52 (4)
Indexing
Wos®
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-53349097830
Wos: WOS:000207534900017
Source Identifiers
ISSN: 1431-9276
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