Characterization of Sputtered Shape Memory Alloy Ni-Ti Films by Cross-Sectional Tem and Sem

AuthID
 P-003-WQ0
6
Author(s)
Muecklich, A
·
Document Type
Editorial Material
Year published
2008
Published
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 14, Issue: SUPPL. 3, Pages: 85-86 (2)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-53349109548
Wos: WOS:000207534900027
Source Identifiers
ISSN: 1431-9276
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service