The Influence of Electric Field on the Microstructure of Nc-Si : H Films Produced by Rf Magnetron Sputtering

AuthID
 P-003-X2F
4
Author(s)
Thaiyalnayaki, V
·
Document Type
Article
Year published
2008
Published
in VACUUM, ISSN: 0042-207X
Volume: 82, Issue: 12, Pages: 1433-1436 (4)
Conference
5Th Iberian Vacuum Meeting, Date: SEP 18-21, 2005, Location: Guimaraes, PORTUGAL, Host: Univ Minho
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Publication Identifiers
SCOPUS: 2-s2.0-49149129532
Wos: WOS:000259460300023
Source Identifiers
ISSN: 0042-207X
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