Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime

AuthID
 P-017-6TH
19
Author(s)
Togawa, M
·
Richter, J
·
Shah, CT
·
Botz, M
·
Nenninger, J
·
Danisch, J
·
Goes, J
·
Kühn, S
·
Mohamed, A
·
Amano, Y
·
Orlando, S
·
Totani, R
·
de Simone, M
·
Fritzsche, S
·
Pfeifer, T
·
Coreno, M
·
Surzhykov, A
·
López-Urrutia, JRC
Document Type
Article
Year published
2024
Published
in PHYSICAL REVIEW LETTERS, ISSN: 0031-9007
Volume: 133, Issue: 16
Indexing
Wos®
Scopus®
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Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 39485972
Scopus: 2-s2.0-85206917974
Wos: WOS:001343530900005
Source Identifiers
ISSN: 0031-9007
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