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Photocapacitance Measurements in Irradiated A-Si : H Based Detectors
AuthID
P-003-ZSD
7
Author(s)
Schwarz, R
·
Mardolcar, U
·
Vygranenko, Y
·
Vieira, M
·
Casteleiro, C
·
Stallinga, P
·
Gomes, H
Document Type
Article
Year published
2008
Published
in
JOURNAL OF NON-CRYSTALLINE SOLIDS,
ISSN: 0022-3093
Volume: 354, Issue: 19-25, Pages: 2176-2180 (5)
Conference
22Nd International Conference on Amorphous and Nanocrystalline Semiconductors,
Date:
AUG 19-24, 2007,
Location:
Breckenridge, CO,
Sponsors:
Univ Toledo, PVIC, NREL, United Solar, Forschungszentrum Julich, Hewlett Packard, OptiSolar, PARC, Sanyo, Sharp
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Metadata
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Publication Identifiers
DOI
:
10.1016/j.jnoncrysol.2007.09.049
SCOPUS
: 2-s2.0-42649129040
Wos
: WOS:000256500400025
Source Identifiers
ISSN
: 0022-3093
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