X-Ray Characterization and Domain Structure of High-Quality Srbi2Ta2O9 Single-Crystals Grown by Self-Flux Solution Method

AuthID
 P-000-CYP
5
Author(s)
Document Type
Article
Year published
2004
Published
in INTEGRATED FERROELECTRICS, ISSN: 1058-4587
Volume: 68, Pages: 259-268 (10)
Conference
16Th International Symposium on Integrated Ferroelectrics/5Th Korean Workshop on High Dielectric Devices and Materials, Date: APR 05-08, 2004, Location: Gyeongju, SOUTH KOREA
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Publication Identifiers
SCOPUS: 2-s2.0-33751172350
Wos: WOS:000226090100028
Source Identifiers
ISSN: 1058-4587
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