Uncertainty Analysis of Impedance Measurements Using Dsp Implemented Ellipse Fitting Algorithms

AuthID
 P-004-59Z
4
Author(s)
Document Type
Proceedings Paper
Year published
2008
Published
in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 in IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS, ISSN: 1091-5281
Pages: 463-467 (5)
Conference
25Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 12-15, 2008, Location: Victoria, CANADA, Sponsors: IEEE Instrumentat & Measurement Soc
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-51349161627
Wos: WOS:000261512100088
Source Identifiers
ISSN: 1091-5281
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service