Application-Level Fault Tolerance in Real-Time Embedded Systems

AuthID
 P-004-5EV
4
Author(s)
Document Type
Proceedings Paper
Year published
2008
Published
in 2008 INTERNATIONAL SYMPOSIUM ON INDUSTRIAL EMBEDDED SYSTEMS
Pages: 126-133 (8)
Conference
International Symposium on Industrial Embedded Systems, Date: JUN 11-13, 2008, Location: La Grande Motte, FRANCE, Sponsors: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-51549109533
Wos: WOS:000260565700017
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