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Standard Histogram Test Precision of Adc Gain and Offset Error Estimation

AuthID
P-004-758

Author(s)

Alegria, FC

Serra, AC

Document Type

Article

Year published

2007

Published

in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456

Volume: 56, Issue: 5, Pages: 1527-1531 (5)

Conference

22Nd Ieee Instrumentation and Measurement Technology Conference, Date: MAY 17-19, 2005, Location: Ottawa, CANADA, Sponsors: IEEE Instrumentat & Measurement Soc

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Publication Identifiers

DOI: 10.1109/tim.2007.907978

SCOPUS: 2-s2.0-34648836347

Wos: WOS:000249619700003

Source Identifiers

ISSN: 0018-9456

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