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Correlation Between Transient Decays in Wide Gap Semiconductors: Photoluminescence Vs. Photocurrent

AuthID
P-004-98Q

Author(s)

Niehus, M

Schwarz, R

Document Type

Article

Year published

2007

Published

in SUPERLATTICES AND MICROSTRUCTURES, ISSN: 0749-6036

Volume: 42, Issue: 1-6, Pages: 299-305 (7)

Conference

Symposium on Zno and Related Materials Held at the 2006 Emrs Spring Meeting, Date: MAY 29-JUN 02, 2006, Location: Nice, FRANCE, Sponsors: European Mat Res Soc

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Publication Identifiers

DOI: 10.1016/j.spmi.2007.04.051

Scopus: 2-s2.0-34548507741

Wos: WOS:000250271200055

Source Identifiers

ISSN: 0749-6036

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Correlation Between Transient Decays in Wide Gap Semiconductors: Photoluminescence Vs. Photocurrent

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