in OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2 in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 6616, Issue: PART 1, Pages: X6160-X6160 (9)
Conference
Conference on Optical Measurement Systems for Industrial Inspection V, Date: JUN 18-22, 2007, Location: Munich, GERMANY, Sponsors: SPIE Europe