A Pattern Recognition System Based on Cluster and Discriminant Analysis for Fault Identification During Production

AuthID
P-004-F31
4
Author(s)
Document Type
Proceedings Paper
Year published
2007
Published
in 2007 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, PROCEEDINGS, VOLS 1-8
Pages: 298-303 (6)
Conference
Ieee International Symposium on Industrial Electronics, Date: JUN 04-07, 2007, Location: Vigo, SPAIN, Sponsors: IEEE
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Publication Identifiers
Scopus: 2-s2.0-50049128940
Wos: WOS:000252265100053
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