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A Metric for the Quantification of Memory Effects in Power Amplifiers
AuthID
P-004-FQ5
4
Author(s)
Martins, JP
·
Cabral, PM
·
Carvalho, NB
·
Pedro, JC
Document Type
Article
Year published
2006
Published
in
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
ISSN: 0018-9480
Volume: 54, Issue: 12, Pages: 4432-4439 (8)
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Scopus
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Publication Identifiers
DOI
:
10.1109/tmtt.2006.882871
SCOPUS
: 2-s2.0-33847728321
Wos
: WOS:000242949000017
Source Identifiers
ISSN
: 0018-9480
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