Modeling Electrical Characteristics of Thin-Film Field-Effect Transistors Ii: Effects of Traps and Impurities

AuthID
 P-004-FZC
2
Author(s)
Document Type
Article
Year published
2006
Published
in SYNTHETIC METALS, ISSN: 0379-6779
Volume: 156, Issue: 21-24, Pages: 1316-1326 (11)
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-33846644947
Wos: WOS:000244626600005
Source Identifiers
ISSN: 0379-6779
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service