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Uv-Raman Scattering Study of Lattice Recovery by Thermal Annealing of Eu+-Implanted Gan Layers

AuthID
P-004-H3J

Author(s)

Pastor, D

Hernandez, S

Cusco, R

Artus, L

Martin, RW

O'Donnell, KP

Briot, O

Lorenz, K

Alves, E

Document Type

Article

Year published

2006

Published

in SUPERLATTICES AND MICROSTRUCTURES, ISSN: 0749-6036

Volume: 40, Issue: 4-6, Pages: 440-444 (5)

Conference

Symposium on Material Science and Technology of Wide Bandgap Semiconductors Held at the 2006 Spring Meeting of the Emrs, Date: MAY 29-JUN 02, 2006, Location: Nice, FRANCE, Sponsors: European Mat Res Soc

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Sources

Publication Identifiers

DOI: 10.1016/j.spmi.2006.06.020

Scopus: 2-s2.0-33845202007

Wos: WOS:000243208200040

Source Identifiers

ISSN: 0749-6036

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Uv-Raman Scattering Study of Lattice Recovery by Thermal Annealing of Eu+-Implanted Gan Layers

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