Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Growth of Sputter-Deposited Ni-Ti Thin Films: Effect of a Sio2 Buffer Layer
AuthID
P-004-J02
6
Author(s)
Martins, RMS
·
Schell, N
·
Beckers, M
·
Mahesh, KK
·
Silva, RJC
·
Fernandes, FMB
Document Type
Article
Year published
2006
Published
in
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,
ISSN: 0947-8396
Volume: 84, Issue: 3, Pages: 285-289 (5)
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1007/s00339-006-3626-9
SCOPUS
: 2-s2.0-33745161503
Wos
: WOS:000238292600011
Source Identifiers
ISSN
: 0947-8396
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service