Publications

Combined Rbs and Tem Characterization of Nano-Sige Layers Embedded in Sio2

AuthID
P-004-JAA

Author(s)

Kling, A

Ortiz, MI

Sangrador, J

Rodriguez, A

Rodriguez, T

BallesteroS, C

Soares, JC

Document Type

Article

Year published

2006

Published

in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X

Volume: 249, Issue: 1-2 SPEC. ISS., Pages: 451-453 (3)

Conference

17Th International Conference on Ion Beam Analysis, Date: JUN 26-JUL 01, 2005, Location: Seville, SPAIN, Sponsors: Univ Autonoma Madrid, Univ Sevilla, Junta Andalucia, Minist Educ & Ciencia, Consejo Superior Investigaciones Cient, Int Atomic Energy Agcy, European Act COST G8, Boem Phys Soc, High Voltage Engn Europa BV, Banco Santander Cent Hispano, Schering Espana

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