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Development of a Yarn Evenness Measurement and Hairiness Analysis System

AuthID
P-004-PWM

Author(s)

Carvalho, V

Cardoso, P

Belsley, M

Vasconcelos, RM

Soares, FO

Document Type

Proceedings Paper

Year published

2006

Published

in IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11 in IEEE Industrial Electronics Society, ISSN: 1553-572X

Pages: 971-976 (6)

Conference

32Nd Annual Conference of the Ieee-Industrial-Electronics-Society, Date: NOV 07-10, 2006, Location: Paris, FRANCE, Sponsors: IEEE Ind Elect Soc

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Publication Identifiers

DOI: 10.1109/iecon.2006.347502

Wos: WOS:000245905001082

Source Identifiers

ISSN: 1553-572X

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Development of a Yarn Evenness Measurement and Hairiness Analysis System

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