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Novel Linearization Technique for Low-Distortion High-Swing Cmos Switches with Improved Reliability

AuthID
P-004-R46

Author(s)

Galhardo, A

Goes, J

Paulino, N

Document Type

Proceedings Paper

Year published

2006

Published

in 2006 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-11, PROCEEDINGS in IEEE International Symposium on Circuits and Systems, ISSN: 0271-4302

Pages: 2001-2004 (4)

Conference

Ieee International Symposium on Circuits and Systems, Date: MAY 21-24, 2006, Location: Kos, GREECE, Sponsors: IEEE

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Metadata
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Publication Identifiers

DOI: 10.1109/iscas.2006.1693006

SCOPUS: 2-s2.0-33847618539

Wos: WOS:000245413502107

Source Identifiers

ISSN: 0271-4302

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Novel Linearization Technique for Low-Distortion High-Swing Cmos Switches with Improved Reliability

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