In Vivo Measurement of the Brain and Skull Resistivities Using an Eit-Based Method and the Combined Analysis of Sef/Sep Data

AuthID
P-000-F9Z
5
Author(s)
de Munck, JC
·
Verbunt, JPA
·
Heethaar, RM
·
da Silva, FHL
Document Type
Article
Year published
2003
Published
in IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, ISSN: 0018-9294
Volume: 50, Issue: 9, Pages: 1124-1128 (5)
Indexing
Publication Identifiers
Pubmed: 12943281
Scopus: 2-s2.0-0037868559
Wos: WOS:000184751800010
Source Identifiers
ISSN: 0018-9294
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