Influence of the Patch Field on Work Function Measurements Based on the Secondary Electron Emission

AuthID
 P-005-0RG
5
Author(s)
Document Type
Article
Year published
2013
Published
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 113, Issue: 18, Pages: 183720 (11)
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-84878098446
Wos: WOS:000319294100053
Source Identifiers
ISSN: 0021-8979
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