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Effects of Geometry Parameters of Ntfet Devices on the I-V Measurements
AuthID
P-005-2PZ
5
Author(s)
Justino, CIL
·
Rocha Santos, TAP
·
Amaral, JP
·
Cardoso, S
·
Duarte, AC
Document Type
Article
Year published
2013
Published
in
SOLID-STATE ELECTRONICS,
ISSN: 0038-1101
Volume: 81, Pages: 32-34 (3)
Indexing
Wos
®
Scopus
®
Crossref
®
3
Google Scholar
®
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Publication Identifiers
DOI
:
10.1016/j.sse.2012.12.013
Scopus
: 2-s2.0-84873355214
Wos
: WOS:000317444400007
Source Identifiers
ISSN
: 0038-1101
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