The Influence of in Situ Photoexcitation on a Defect Structure Generation in Ar+ Implanted Gaas(001) Crystals Revealed by High-Resolution X-Ray Diffraction and Rutherford Backscattering Spectroscopy

AuthID
 P-000-GM5
7
Author(s)
Chtcherbatchev, KD
·
Bublik, VT
·
Markevich, AS
·
Document Type
Article
Year published
2003
Published
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 36, Issue: 10A, Pages: A143-A147 (5)
Conference
X-Top 2002 Conference, Date: 2002, Location: GRENOBLE, FRANCE
Indexing
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-0038621871
Wos: WOS:000183446300030
Source Identifiers
ISSN: 0022-3727
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