Local Electromechanical Properties and Grain Size Effects in Ferroelectric Relaxors Studied by Scanning Piezoelectric Microscopy

AuthID
P-000-JMV
4
Author(s)
Woitas, M
·
Safari, A
5
Editor(s)
Kaufman, DY; HoffmannEifert, S; Gilbert, SR; Aggarwal, S; Shimizu, M
Document Type
Proceedings Paper
Year published
2003
Published
in FERROELECTRIC THIN FILMS XI in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, ISSN: 0272-9172
Volume: 748, Pages: 343-348 (6)
Conference
Symposium on Ferroelectric Thin Films Xi Held at the 2002 Mrs Fall Meeting, Date: DEC 02-05, 2002, Location: BOSTON, MA, Sponsors: Mat Res Soc, Kojundo Chem Lab Co Ltd, Seiko Epson Corp, ULVAC Inc
Indexing
Publication Identifiers
Scopus: 2-s2.0-0038375325
Wos: WOS:000183409100049
Source Identifiers
ISSN: 0272-9172
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