Dual Tone Analysis for Phase-Plane Coverage in Adc Metrological Characterization

AuthID
 P-000-JVP
3
Author(s)
Monteiro, CL
·
Arpaia, P
·
Document Type
Proceedings Paper
Year published
2003
Published
in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2 in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 2, Pages: 1334-1339 (6)
Conference
20Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 20-22, 2003, Location: VAIL, CO, Sponsors: IEEE Instrumentat & Measurement Soc
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0037484092
Wos: WOS:000183417200255
Source Identifiers
ISSN: 1091-5281
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