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Comparison of Low- and Room-Temperature Damage Formation in Ar Ion Implanted Gan and Zno
AuthID
P-006-965
7
Author(s)
Wendler, E
·
Wesch, W
·
Azarov, AY
·
Catarino, N
·
Redondo Cubero, A
·
Alves, E
·
Lorenz, K
Document Type
Article
Year published
2013
Published
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
ISSN: 0168-583X
Volume: 307, Pages: 394-398 (5)
Conference
18Th International Conference on Ion Beam Modifications of Materials (Ibmm),
Date:
SEP 02-07, 2012,
Location:
Qingdao, PEOPLES R CHINA,
Sponsors:
Shanghai Inst Microsystem & Informat Technol, Tsinghua Univ, Natl Nat Sci Fdn China, Shandong Univ, Minist Educ, Key Lab Particle Phys & Particle Irradiat, Shandong Univ, State Key Lab Crystal Mat, High Voltage Engn Europa B V,
Host:
Shandong Univ
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Metadata
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Publication Identifiers
DOI
:
10.1016/j.nimb.2013.01.020
SCOPUS
: 2-s2.0-84885181238
Wos
: WOS:000321722200088
Source Identifiers
ISSN
: 0168-583X
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