Combined Spectral and Histogram Analysis for Fast Adc Testing

AuthID
 P-000-23J
6
Author(s)
da Silva, MF
·
Michaeli, L
·
Saliga, J
Document Type
Article
Year published
2005
Published
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 54, Issue: 4, Pages: 1617-1623 (7)
Conference
21St Ieee Instrumentation and Measurement Technology Conference, Date: MAY 18-20, 2004, Location: Como, ITALY, Sponsors: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
SCOPUS: 2-s2.0-23344452098
Wos: WOS:000230628600043
Source Identifiers
ISSN: 0018-9456
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