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Adc Testing Using Joint Time-Frequency Analysis
AuthID
P-007-8RT
3
Author(s)
Mendonca, HS
·
Silva, JM
·
Matos, JS
Document Type
Proceedings Paper
Year published
1999
Published
in
THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS
in
IEE CONFERENCE PUBLICATIONS,
ISSN: 0537-9989
Issue: 466, Pages: 157-159 (3)
Conference
3Rd International Conference on Advanced A/D and D/A Conversion Techniques and Their Applications,
Date:
JUL 27-28, 1999,
Location:
GLASGOW, SCOTLAND,
Sponsors:
IEE, Electr & Commun Div, EUREL, IMEKO, IMC,
Host:
UNIV STRATHCLYDE
Indexing
Wos
®
Scopus
®
Crossref
®
1
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1049/cp:19990486
SCOPUS
: 2-s2.0-0033330897
Wos
: WOS:000167172600038
Source Identifiers
ISSN
: 0537-9989
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