Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Microstructural Characterisation of Y-Tial Joints
AuthID
P-000-QNH
6
Author(s)
Guedes, A
·
Pinto, AMP
·
Vieira, M
·
Viana, F
·
Ramos, AS
·
Vieira, MT
1
Editor(s)
Vieira, T
Document Type
Article
Year published
2002
Published
in
ADVANCED MATERIALS FORUM I
in
KEY ENGINEERING MATERIALS,
ISSN: 1013-9826
Volume: 230-2, Pages: 27-30 (4)
Conference
1St International Materials Symposium (Materials 2001),
Date:
APR 09-11, 2001,
Location:
COIMBRA, PORTUGAL,
Sponsors:
Portuguese Soc Mat,
Host:
UNIV COIMBRA
Indexing
Wos
®
Scopus
®
Crossref
®
5
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.4028/www.scientific.net/kem.230-232.27
SCOPUS
: 2-s2.0-0036430590
Wos
: WOS:000179553200004
Source Identifiers
ISSN
: 1013-9826
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service