Precision of Adc Gain and Offset Error Estimation with the Standard Histogram Test

AuthID
 P-007-H2Y
2
Author(s)
Document Type
Proceedings Paper
Year published
2005
Published
in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 1, Pages: 282-286
Conference
Imtc'05 - Proceedings of the Ieee Instrumentation and Measurement Technology Conference, Date: 16 May 2005 through 19 May 2005, Location: Ottawa, ON
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-33847185609
Source Identifiers
ISSN: 1091-5281
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service