Dielectric Breakdown in Underoxidized Magnetic Tunnel Junctions

AuthID
 P-007-N2C
4
Author(s)
Document Type
Proceedings Paper
Year published
2006
Published
in INTERMAG 2006 - IEEE International Magnetics Conference
Pages: 727
Conference
Intermag 2006 - Ieee International Magnetics Conference, Date: 8 May 2006 through 12 May 2006, Location: San Diego, CA
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Publication Identifiers
SCOPUS: 2-s2.0-50249179197
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