Influence of Test Conditions on the Quality of Pcs Results

AuthID
 P-007-P1G
2
Author(s)
Vasquez, A
Document Type
Proceedings Paper
Year published
2006
Published
in AIChE Annual Meeting, Conference Proceedings
Conference
2006 Aiche Spring National Meeting - 5Th World Congress on Particle Technology, Date: 23 April 2006 through 27 April 2006, Location: Orlando, FL, Sponsors: Univ. of Pittsburgh School of Eng.;AICHE - Nanotechnology Forum;AICHE - Particle Technology Forum;Beckman Coulter;Malvern Instruments
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-56749154146
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