A Comparison Between Voltage and True Power Based Embedded Measurements for Rf Testing

AuthID
 P-007-V26
2
Author(s)
Document Type
Proceedings Paper
Year published
2010
Published
in Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010
Conference
2010 Ieee 16Th International Mixed-Signals, Sensors and Systems Test Workshop, Ims3Tw 2010, Date: 7 June 2010 through 9 June 2010, Location: Montpellier, La Grande Motte
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Publication Identifiers
SCOPUS: 2-s2.0-77955291162
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