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A Comparison Between Voltage and True Power Based Embedded Measurements for Rf Testing

AuthID
P-007-V26

Author(s)

Mota, P

Da Silva, JM

Document Type

Proceedings Paper

Year published

2010

Published

in Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010

Conference

2010 Ieee 16Th International Mixed-Signals, Sensors and Systems Test Workshop, Ims3Tw 2010, Date: 7 June 2010 through 9 June 2010, Location: Montpellier, La Grande Motte

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Publication Identifiers

DOI: 10.1109/ims3tw.2010.5503003

Scopus: 2-s2.0-77955291162

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A Comparison Between Voltage and True Power Based Embedded Measurements for Rf Testing

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