Publications

Evaluation of Rf Pa Nonlinearities Based on Cross-Correlation Between Current and Output Voltage

AuthID
P-007-VWG

Author(s)

Mota, P

Da Silva, JM

Veiga, R

Document Type

Proceedings Paper

Year published

2010

Published

in 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010

Conference

5Th Conference on Design and Technology of Integrated Systems in Nanoscale Era, Dtis 2010, Date: 23 March 2010 through 25 March 2010, Location: Hammamet, Sponsors: IEEE;Bebcom Technology;ST;IEEE Circuits and Systems Society (CAS)

Indexing

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1109/dtis.2010.5487560

Scopus: 2-s2.0-77957910910

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

Evaluation of Rf Pa Nonlinearities Based on Cross-Correlation Between Current and Output Voltage

Useful Links

Get Help

Federated Authentication (Click on the image)

Evaluation of Rf Pa Nonlinearities Based on Cross-Correlation Between Current and Output Voltage

Useful Links

Get Help