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Electrical Characterization of Ge Nanocrystals in Oxide Matrix
AuthID
P-008-3JM
9
Author(s)
Capan, I
·
Buljan, M
·
Misic Radic, T
·
Pivac, B
·
Radic, N
·
Grenzer, J
·
Holy, V
·
Levichev, S
·
Bernstorff, S
Document Type
Proceedings Paper
Year published
2011
Published
in
Materials Research Society Symposium Proceedings,
ISSN: 0272-9172
Volume: 1305, Pages: 53-57
Conference
2010 Mrs Fall Meeting,
Date:
29 November 2010 through 3 December 2010,
Location:
Boston, MA
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Metadata
Sources
Publication Identifiers
DOI
:
10.1557/opl.2011.298
SCOPUS
: 2-s2.0-84860115300
Source Identifiers
ISSN
: 0272-9172
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