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Integrated Silicon Microspectrometers
AuthID
P-000-TD5
5
Author(s)
Kong, SH
·
Correia, JH
·
de Graaf, G
·
Bartek, M
·
Wolffenbuttel, RF
Document Type
Article
Year published
2001
Published
in
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE,
ISSN: 1094-6969
Volume: 4, Issue: 3, Pages: 34-38 (5)
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Publication Identifiers
DOI
:
10.1109/5289.953457
Scopus
: 2-s2.0-0035450419
Wos
: WOS:000170572100008
Source Identifiers
ISSN
: 1094-6969
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