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A Critical Note to Ieee 1057-94 Standard on Hysteretic Adc Dynamic Testing
AuthID
P-000-TQ8
4
Author(s)
Arpaia, P
·
Serra, AMD
·
Daponte, P
·
Monteiro, CL
Document Type
Article
Year published
2001
Published
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
ISSN: 0018-9456
Volume: 50, Issue: 4, Pages: 941-948 (8)
Conference
Instrumentation and Measurement Technology Conference (Imtc 2000),
Date:
MAY 01-04, 2000,
Location:
BALTIMORE, MARYLAND
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Publication Identifiers
DOI
:
10.1109/19.948304
SCOPUS
: 2-s2.0-0035414883
Wos
: WOS:000170885300018
Source Identifiers
ISSN
: 0018-9456
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