Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Fpga Controlled Mems Inclinometer
AuthID
P-008-CTR
5
Author(s)
Alves, FS
·
Dias, RA
·
Cabral, J
·
Rocha, LA
·
Monteiro, J
Document Type
Proceedings Paper
Year published
2013
Published
in
2013 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE)
Conference
Ieee International Symposium on Industrial Electronics (Isie),
Date:
MAY 28-31, 2013,
Location:
Taipei, TAIWAN,
Sponsors:
IEEE
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/isie.2013.6563729
SCOPUS
: 2-s2.0-84881628147
Wos
: WOS:000326324900141
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service