Publications

Low Cost Pressure Mapping Platform for Mobility Monitoring Applications

AuthID
P-008-CYR

Author(s)

Cruz, S

Vieira, NJ

Viana, JC

Rocha, LA

Editor(s)

Ferrero,A

Document Type

Proceedings Paper

Year published

2013

Published

in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281

Pages: 967-970 (4)

Conference

Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 06-09, 2013, Location: Minneapolis, MN, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc, Boston Sci, Natl Instruments, Medtronic, Natl Appl Res Lab, Instrument Technol Res Ctr

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