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Influence of the Incident Angle on Energy Dependence of a Secondary Electron Emission Yield

AuthID
P-008-DJJ

Author(s)

Bundaleski, N

Belhaj, M

Gineste, T

Teodoro, OMND

Document Type

Proceedings Paper

Year published

2013

Published

in 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

Conference

14Th Ieee International Vacuum Electronics Conference, Ivec 2013, Date: 21 May 2013 through 23 May 2013, Location: Paris, Sponsors: THALES;CBL Ceramics Ltd.;CST

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Metadata
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Publication Identifiers

DOI: 10.1109/ivec.2013.6570958

SCOPUS: 2-s2.0-84883323272

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Influence of the Incident Angle on Energy Dependence of a Secondary Electron Emission Yield

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