In-Situ Tem Annealing of Nanocrystalline Copper Thin Films

AuthID
 P-008-HFX
6
Author(s)
Document Type
Note
Year published
2007
Published
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 13, Issue: SUPPL.2, Pages: 574-575
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Publication Identifiers
SCOPUS: 2-s2.0-84888263561
Source Identifiers
ISSN: 1431-9276
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